FIB-SEM Engineer of the EM Center

Wenjing Zhang, Focused Ion Beam – Scanning Electron Microscope (FIB-SEM) Engineer of the Electron Microscopy Center, joined GTIIT in July 2020. She received her master’s degree in physics from Beijing University of Technology in 2020 and her bachelor’s degree in metal material engineering from Taiyuan University of Technology in 2017. She has participated in multiple scientific research projects and her research mainly focused on the use of electron microscopy methods to investigate the relationship between the microstructure evolution and mechanical properties of superalloys. She has accumulated rich practical experience in electron microscopy and is good at the multi-module analysis function of SEM and FIB, and familiar with various TEM sample preparation methods of metals, ceramics, semiconductor devices and new energy materials. 

Office: R730                   Tel: 0754-8807 7169                Email: wenjing.zhang@gtiit.edu.cn                  Lab: FIB-RB05