FIB-SEM Engineer of the EM Center

Tao Zhang, Focused Ion Beam – Scanning Electron Microscope (FIB‑SEM) Engineer of the Electron Microscopy Center. He received his Master’s degree in Materials and Chemical Engineering from Hubei University in June 2026. During his master’s studies, he worked at the Electron Microscopy Center of Hubei University, where he mainly handled sample preparation, characterization and analysis for various materials such as metals, ceramics, and semiconductor devices. He was also in charge of equipment maintenance and calibration. Through this work, he gained rich hands‑on experience and built a solid foundation in materials science. He has also taken part in publishing several academic papers. In July 2026, Zhang Tao joined GTIIT, where he continues to focus on his work in the field of electron microscopy technology.

Office: R730                 Tel: 8807 7169                Email: tao.zhang@gtiit.edu.cn                  Lab: FIB-RB05