TOFSIMS (Time-of-Flight Secondary Ion Mass Spectrometry) is a powerful surface analysis technique that can provide high-resolution, high-sensitivity chemical composition analysis and imaging of solid surfaces. By using laser or ion beam irradiation on the sample surface, TOFSIMS generates a large amount of secondary ions that are collected and analyzed by mass spectrometry. This allows researchers to determine the chemical composition, structure, and distribution on the sample surface with high precision and accuracy, even at sub-micron spatial resolution. TOFSIMS is widely used in materials science, biomedical research, nanotechnology, and other fields to analyze compound distribution, surface chemical reactions, cell component analysis, and more. Its high resolution and sensitivity make it an invaluable tool for understanding the properties of surfaces and interfaces, including multi-layered structures and depth profiles. Overall, TOFSIMS is a critical analytical tool that has greatly contributed to the advancement of surface science and technology.
Established in 2022, our lab at RB07 is equipped with state-of-the-art TOF.SIMS 5 instrumentation, offering unparalleled capabilities in surface characterization, depth profiling, and molecular imaging. We serve as a focal point for researchers exploring surface composition and structure at the molecular level. Our dedicated team provides comprehensive support, from experimental design to data analysis, to help you achieve your research goals. Whether you’re from academia or industry, we welcome you to leverage our expertise and resources.
Applications:
● Thin films
● Polymers
● Paints and Coatings
● Semiconductors
● and more…